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Samsung patents method to predict radiation damage in chips

Patent drawing
Patent drawing from the official filing.

Samsung describes a way to check if a computer chip has been damaged by radiation, such as from space or medical equipment. The method uses a computer model to compare the chip's electrical resistance against a healthy baseline to estimate the likelihood of failure.

Why it mattersThis could help manufacturers ensure chips remain reliable in harsh environments like satellites or nuclear facilities.

In the filing’s own words

A method for predicting a defect in a semiconductor device using a defect prediction model, the method includes obtaining reference data on resistance of a semiconductor element of the semiconductor device under conditions in which damage caused by radiation has not occurred, inputting input data of conditions in which damage caused by radiation has occurred to the defect prediction model to obtain prediction data on the resistance of the semiconductor element, predicting an element defect probability of the semiconductor element caused by damage from radiation using the reference data and the prediction data, and calculating a device defect probability of the semiconductor device comprising the semiconductor element using the element defect probability.

What exactly they claim (claim 1)

1. A method for predicting a defect in a semiconductor device using a defect prediction model, the method comprising: obtaining reference data on resistance of a semiconductor element of the semiconductor device under conditions in which damage caused by radiation has not occurred; inputting input data of conditions in which damage caused by radiation has occurred to the defect prediction model to obtain prediction data on the resistance of the semiconductor element; predicting an element defect probability of the semiconductor element caused by damage from radiation using the reference data and the prediction data; and calculating a device defect probability of the semiconductor device comprising the semiconductor element using the element defect probability.

Facts

Company
Samsung (Samsung Electronics Co., Ltd.)
Official title
METHOD FOR PREDICTING DEFECT IN SEMICONDUCTOR DEVICE
Publication number
US20260309768A1
Application number
19715915
Filed
Jun 22, 2026
Published
Oct 8, 2026
Inventors
9
Claims
20

Classified under

G01R 31/2848 Physics & computingG01T 1/24 Physics & computingG06F 30/20 Physics & computingG06N 20/00 Physics & computingG06T 7/0008 Physics & computingH10P 72/0616 Electricity & electronics

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Summaries are simplified from the filing’s own abstract and first claim. A patent filing is not a product announcement.
Patent data and drawings: U.S. Patent and Trademark Office (USPTO). Nebula is not affiliated with or endorsed by the USPTO.