Samsung patents laser trick to fix alignment on chip-making masks
Samsung has filed a patent for a method to improve the accuracy of extreme ultraviolet (EUV) masks used in making advanced computer chips. The technique involves using a laser or electron beam to create a specific, uneven deformation in the mask's reflective layer. This physical change helps correct the alignment of the circuit patterns on the mask.
In the filing’s own words
A registration control method includes irradiating a laser beam or an E-beam onto a reflective multilayer of an EUV mask, the EUV mask having a substrate, the reflective multilayer on the substrate, and an absorption layer on the reflective multilayer, generating an asymmetrical deformation element in the reflective multilayer, and correcting the registration of a pattern formed on the absorption layer.
What exactly they claim (claim 1)
1. A method of controlling registration of an extreme ultra-violet (EUV) mask, the method comprising: irradiating a laser beam or an E-beam onto a reflective multilayer of the EUV mask comprising a substrate, the reflective multilayer on the substrate, and an absorption layer on the reflective multilayer; generating an asymmetric deformation element in the reflective multilayer; and correcting the registration of a pattern formed in the absorption layer.
Facts
- Company
- Samsung (Samsung Electronics Co., Ltd.)
- Official title
- EUV MASK REGISTRATION CONTROL METHOD AND EUV MASK MANUFACTURING METHOD INCLUDING THE CONTROL METHOD
- Publication number
- US20260299397A1
- Application number
- 19389842
- Filed
- Nov 14, 2025
- Published
- Oct 1, 2026
- Inventors
- 2
- Claims
- 20
Classified under
G03F 1/24 Physics & computingG03F 1/54 Physics & computingG03F 1/86 Physics & computingMore from Samsung in Chips & hardware
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Summaries are simplified from the filing’s own abstract and first claim. A patent filing is not a product announcement.
Patent data and drawings: U.S. Patent and Trademark Office (USPTO). Nebula is not affiliated with or endorsed by the USPTO.
