Samsung patents inspection tool with moving contact points for testing chips
Samsung has filed a patent for a testing device used to check the electrical properties of electronic components. The device uses a layer of small, movable contact points that press against the item being tested to ensure a reliable connection during the inspection process.
In the filing’s own words
Provided is an inspection apparatus configured to test characteristics of an inspection target, the inspection apparatus including a contact layer configured to come into contact with an inspection point of the inspection target, a socket substrate on the contact layer opposite to the inspection target, and a conductive body connected to the socket substrate, opposite to the contact layer, the conductive body being connected to the inspection target through the socket substrate and the contact layer, wherein the contact layer includes a plurality of contact sections, each contact section of the plurality of contact sections includes a contact surface configured to contact the inspection point of the inspection target, the contact surface being configured to move in a first direction.
What exactly they claim (claim 1)
1. An inspection apparatus configured to test characteristics of an inspection target, the inspection apparatus comprising: a contact layer configured to come into contact with an inspection point of the inspection target; a socket substrate on the contact layer opposite to the inspection target; and a conductive body connected to the socket substrate, opposite to the contact layer, the conductive body being connected to the inspection target through the socket substrate and the contact layer, wherein the contact layer comprises a plurality of contact sections, each contact section of the plurality of contact sections comprises a contact surface configured to contact the inspection point of the inspection target, and the contact surface is configured to move in a first direction.
Facts
- Company
- Samsung (SAMSUNG ELECTRONICS CO., LTD.)
- Official title
- INSPECTION MEMBER
- Publication number
- US20260298974A1
- Application number
- 19629824
- Filed
- Mar 26, 2026
- Published
- Oct 1, 2026
- Inventors
- 4
- Claims
- 20
Classified under
G01R 1/0433 Physics & computingMore from Samsung in Chips & hardware
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Summaries are simplified from the filing’s own abstract and first claim. A patent filing is not a product announcement.
Patent data and drawings: U.S. Patent and Trademark Office (USPTO). Nebula is not affiliated with or endorsed by the USPTO.