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Samsung patents thin film method with longer plasma step

Patent drawing
Patent drawing from the official filing.

Samsung describes a specific sequence for building ultra-thin layers of material on chips using atomic layer deposition. The method involves alternating gas supplies and plasma treatments, with a key adjustment where one plasma step lasts longer than the initial gas supply step.

Why it mattersThis is a routine process improvement for chip manufacturing that may help create more precise semiconductor layers.

In the filing’s own words

A method of manufacturing a thin film by using an atomic layer deposition method including at least one cycle, and the at least one cycle includes forming a first adsorption layer onto a substrate for a first supply time, supplying a first purge gas onto the first adsorption layer for a first purge time, forming a second adsorption layer by supplying an inert gas in a plasma state onto the first adsorption layer for a second supply time, supplying a second purge gas onto the second adsorption layer for a second purge time, supplying a reactant gas in a plasma state onto the second adsorption layer for a third supply time to form a thin film, and supplying a third purge gas onto the thin film for a third purge time, in which the second supply time is longer than the first supply time.

What exactly they claim (claim 1)

1. A method of manufacturing a thin film by using an atomic layer deposition method including at least one cycle, wherein the at least one cycle includes: forming a first adsorption layer by supplying a metal precursor onto a substrate for a first supply time; supplying a first purge gas onto the first adsorption layer for a first purge time; forming a second adsorption layer by supplying an inert gas in a plasma state onto the first adsorption layer for a second supply time; supplying a second purge gas onto the second adsorption layer for a second purge time; supplying a reactant gas in a plasma state onto the second adsorption layer for a third supply time to allow the second adsorption layer to react with the reactant gas to form a thin film; and supplying a third purge gas onto the thin film for a third purge time, wherein the second supply time is longer than the first supply time.

Facts

Company
Samsung (SAMSUNG ELECTRONICS CO., LTD.)
Official title
METHOD OF MANUFACTURING THIN FILM BY USING ATOMIC LAYER DEPOSITION METHOD AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE USING THE SAME
Publication number
US20260297746A1
Application number
19576409
Filed
Mar 24, 2026
Published
Oct 1, 2026
Inventors
3
Claims
20

Classified under

C23C 16/4554 Chemistry & metalsC23C 16/4408 Chemistry & metalsC23C 16/45542 Chemistry & metalsC23C 16/45553 Chemistry & metalsC23C 16/505 Chemistry & metalsH10D 30/031 Electricity & electronics

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Summaries are simplified from the filing’s own abstract and first claim. A patent filing is not a product announcement.
Patent data and drawings: U.S. Patent and Trademark Office (USPTO). Nebula is not affiliated with or endorsed by the USPTO.