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Samsung patents 3D memory using ferroelectric layers

Samsung describes a method for building a 3D memory chip by stacking layers of gate electrodes and ferroelectric material. The process involves creating holes and recesses in a stack of insulating and sacrificial layers, then filling them with electrodes and ferroelectric material to form the memory cells.

Why it mattersThis filing protects a specific manufacturing technique for a type of memory that could potentially offer different performance or power characteristics than standard chips.

In the filing’s own words

Provided is a 3D ferroelectric memory device. The 3D ferroelectric memory device may include a plurality of gate electrodes stacked on a substrate in a first direction; a plurality of ferroelectric layers on the plurality of gate electrodes in a second direction; a plurality of intermediate electrodes on the plurality of ferroelectric layers in the second direction; a first insulating layer between the plurality of gate electrodes and between the plurality of intermediate electrodes; a second insulating layer on the plurality of intermediate electrodes and the first insulating layer; and a channel layer on the second insulating layer.

What exactly they claim (claim 1)

1. A method of manufacturing a semiconductor device, the method comprising: alternately stacking a plurality of first insulating layers and a plurality of sacrificial layers on a substrate; forming a channel hole through the plurality of first insulating layers and the plurality of sacrificial layers; forming a plurality of first recesses by etching the plurality of sacrificial layers exposed through the channel hole to a given depth; forming a plurality of second recesses by etching portions of the plurality of first insulating layers exposed through the plurality of first recesses; forming a plurality of intermediate electrodes to fill the plurality of second recesses; depositing a second insulating layer and a channel layer on an inner wall of the channel hole; removing the plurality of sacrificial layers; depositing a plurality of ferroelectric layers on inner walls of spaces from which the plurality of sacrificial layers are removed; and forming a plurality of gate electrodes inside the plurality of ferroelectric layers.

Facts

Company
Samsung (Samsung Electronics Co., Ltd.)
Official title
3D FERROELECTRIC MEMORY DEVICE
Publication number
US20260282383A1
Application number
19673242
Filed
May 11, 2026
Published
Sep 17, 2026
Inventors
4
Claims
15

Classified under

H10B 53/20 Electricity & electronicsG11C 11/223 Physics & computingH10B 51/20 Electricity & electronicsH10B 51/30 Electricity & electronicsH10B 53/30 Electricity & electronics

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Summaries are simplified from the filing’s own abstract and first claim. A patent filing is not a product announcement.
Patent data and drawings: U.S. Patent and Trademark Office (USPTO). Nebula is not affiliated with or endorsed by the USPTO.