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Google patents method to test quantum chip accuracy in parallel

This filing describes a way to check how well a quantum computer's hardware works by running specific test patterns across its qubits. Instead of testing qubits one by one, the method groups them into layers that can be tested simultaneously to gather data faster. The results are then used to fine-tune the control settings for the quantum gates.

Why it mattersIt provides a technical method for improving the reliability of quantum processors, which is a key hurdle for making quantum computing practical.

In the filing’s own words

Methods, systems and apparatus for benchmarking quantum computing hardware. In one aspect, a method includes defining an initial circuit configured to operate on an array of qubits, wherein the initial circuit comprises multiple instances of the two-qubit gate, wherein each instance of the two-qubit gate performs a same operation on a respective pair of neighboring qubits in the array; partitioning the initial circuit into multiple layers, wherein instances of the two-qubit gate in a respective layer can be implemented in parallel; for each of the multiple layers: constructing benchmarking circuits for the layer, wherein each benchmarking circuit for the layer comprises one or more cycles of quantum gates, each cycle comprising: the layer of instances of the two-qubit gate, and a plurality of single qubit gates; implementing the constructed benchmarking circuits to obtain experimental benchmarking data; and adjusting control parameters of the control model using the experimental benchmarking data.

What exactly they claim (claim 1)

1. A method comprising: for each of multiple layers of instances of a two-qubit gate, wherein each instance of the two-qubit gate performs a same operation on a respective pair of neighboring qubits in an array of qubits and instances of the two-qubit gate in a respective layer can be implemented in parallel: implementing one or more benchmarking circuits for the layer to obtain experimental benchmarking data, wherein each benchmarking circuit for the layer comprises one or more cycles of quantum gates, each cycle comprising: the layer of instances of the two-qubit gate, and a plurality of single qubit gates, wherein each single qubit gate in the plurality of single qubit gates corresponds to a respective qubit in the array of qubits; and determining control parameters for implementing the two-qubit gate using the experimental benchmarking data.

Facts

Company
Google (Google LLC)
Official title
Parallel Cross Entropy Benchmarking
Publication number
US20260268187A1
Application number
19009622
Filed
Jan 3, 2025
Published
Sep 10, 2026
Inventors
4
Claims
20

Classified under

G06N 10/20 Physics & computingG06N 10/70 Physics & computing
Read the full filing (official PDF) ↗ Open in the Patent Tracker

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Summaries are simplified from the filing’s own abstract and first claim. A patent filing is not a product announcement.
Patent data and drawings: U.S. Patent and Trademark Office (USPTO). Nebula is not affiliated with or endorsed by the USPTO.