Samsung patents method to fix timing errors in power grid sensors
Samsung has filed a patent for a method to detect and correct measurement errors in intelligent electronic devices (IEDs) used in power systems. The system uses a higher-level controller to calculate phase and time differences between voltage data from two devices, then adjusts the time to ensure accurate readings.
In the filing’s own words
Provided is a method of detecting measurement errors in intelligent electronic devices (IEDs), the method including measuring voltages and currents by a first IED and a second IED, calculating, by a higher controller, phase difference compensation from received voltage data, calculating, by the higher controller, time difference compensation from the phase difference compensation, and calculating a corrected time from the time difference compensation.
What exactly they claim (claim 1)
1. A method of detecting measurement errors in intelligent electronic devices (IEDs), the method comprising: measuring voltages and currents by a first IED and a second IED of the IEDs; calculating, by a higher controller, phase difference compensation from received voltage data; calculating, by the higher controller, time difference compensation from the phase difference compensation; and calculating a corrected time from the time difference compensation.
Facts
- Company
- Samsung (SAMSUNG ELECTRONICS CO., LTD.)
- Official title
- METHOD OF DETECTING MEASUREMENT ERRORS IN INTELLIGENT ELECTRONIC DEVICES
- Publication number
- US20260261121A1
- Application number
- 19530631
- Filed
- Feb 5, 2026
- Published
- Sep 3, 2026
- Inventors
- 5
- Claims
- 20
Classified under
H02J 3/08 Electricity & electronicsH02J 3/18 Electricity & electronicsMore from Samsung in Chips & hardware
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Summaries are simplified from the filing’s own abstract and first claim. A patent filing is not a product announcement.
Patent data and drawings: U.S. Patent and Trademark Office (USPTO). Nebula is not affiliated with or endorsed by the USPTO.