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Samsung patents chip design that uses laser heat to test for defects

Patent drawing
Patent drawing from the official filing.

This patent describes a semiconductor chip with special test areas built into the unused space around the main circuit. These areas contain tiny circuits that produce a small electrical leak when hit by a laser, allowing engineers to check if the chip is working correctly during manufacturing.

Why it mattersThis improves the quality control process for making computer chips, ensuring fewer defective parts reach the market.

In the filing’s own words

A semiconductor chip includes a semiconductor substrate having a first surface and a second surface opposite to the first surface. The semiconductor substrate includes a circuit pattern region and a peripheral region surrounding the circuit pattern region, an activation layer on the second surface of the semiconductor substrate and having a plurality of circuit patterns in the circuit pattern region, and at least one scattering detection pattern in the peripheral region and having a plurality of circuit cells that generate leakage current based on a scattered beam or heat of a laser.

What exactly they claim (claim 1)

1. A semiconductor chip, comprising: a semiconductor substrate having a first surface and a second surface opposite to the first surface, the semiconductor substrate including a circuit pattern region and a peripheral region surrounding the circuit pattern region; an activation layer on the second surface of the semiconductor substrate, the activation layer having a plurality of circuit patterns in the circuit pattern region; and at least one scattering detection pattern in the peripheral region, the at least one scattering detection pattern having a plurality of circuit cells configured to generate a leakage current based on a scattered beam or heat of a laser.

Facts

Company
Samsung (Samsung Electronics Co., Ltd.)
Official title
Semiconductor chip, semiconductor device including semiconductor chips, and method of inspecting the semiconductor device
Patent number
US12765329B2
Application number
18635180
Filed
Apr 15, 2024
Granted
Oct 13, 2026
Inventors
4
Claims
20

Classified under

H10P 74/277 Electricity & electronics

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Summaries are simplified from the filing’s own abstract and first claim. A patent filing is not a product announcement.
Patent data and drawings: U.S. Patent and Trademark Office (USPTO). Nebula is not affiliated with or endorsed by the USPTO.