Samsung patents circuit to measure timing errors in electronic signals
This patent describes a circuit that measures 'jitter,' which is the unwanted variation in the timing of an electronic signal. It works by comparing the input signal to a reference, calculating the phase difference, and using a feedback loop to stabilize the measurement.
In the filing’s own words
A jitter measurement circuit for measuring a jitter of an input signal, the jitter measurement circuit including: a multiplexer configured to output a first comparison signal or a second comparison signal in response to an output signal; a detecting circuit configured to output a detection signal corresponding to a phase difference between an output of the multiplexer and the input signal; a first adder configured to sum the detection signal and a feedback signal; an integrating circuit configured to integrate and output an output of the first adder; a feedback circuit configured to trim an output of the integrating circuit to generate the feedback signal; and a comparator configured to generate an output signal by comparing the output of the integrating circuit with a reference potential.
What exactly they claim (claim 1)
1. A jitter measurement circuit for measuring a jitter of an input signal, the jitter measurement circuit comprising: a multiplexer configured to output a first comparison signal or a second comparison signal in response to an output signal; a detecting circuit configured to output a detection signal corresponding to a phase difference between an output of the multiplexer and the input signal; a first adder configured to sum the detection signal and a feedback signal; an integrating circuit configured to integrate and output an output of the first adder; a feedback circuit configured to trim an output of the integrating circuit to generate the feedback signal; and a comparator configured to generate an output signal by comparing the output of the integrating circuit with a reference potential.
Facts
- Company
- Samsung (SAMSUNG ELECTRONICS CO., LTD.)
- Official title
- Jitter measurement circuit and jitter measurement method
- Patent number
- US12761274B2
- Application number
- 18823768
- Filed
- Sep 4, 2024
- Granted
- Oct 13, 2026
- Inventors
- 6
- Claims
- 20
Classified under
G01R 31/31709 Physics & computingG01R 31/31703 Physics & computingG01R 31/31711 Physics & computingG01R 31/31712 Physics & computingMore from Samsung in Chips & hardware
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Summaries are simplified from the filing’s own abstract and first claim. A patent filing is not a product announcement.
Patent data and drawings: U.S. Patent and Trademark Office (USPTO). Nebula is not affiliated with or endorsed by the USPTO.