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SamsungGranted patentChips & hardwareInterest 2/10

Samsung patents a fixture that holds chips steady during testing

Patent drawing
Patent drawing from the official filing.

This filing describes a mechanical fixture used to test semiconductor chips. It uses a base plate, elastic cylinders, and locking stops to hold a chip in place between a top plate and a substrate cover.

Why it mattersIt is a specific piece of testing equipment that helps ensure chips are held securely during quality checks.

In the filing’s own words

A semiconductor test apparatus includes a base plate, side supporters provided as three or more on a lower surface of the base plate, an elastic cylinder and a side stopper provided on a lower surface of each of the side supporters, a center stopper provided laterally apart from the side supporters on the lower surface of the base plate, a stopper foot provided at one end of the center stopper, a foot supporter provided at one end of the stopper foot, a top plate disposed under the base plate to contact the elastic cylinder and the side stopper, the top plate including a center hole in a center portion thereof, and a substrate cover provided under the top plate, wherein the center stopper and the side stopper are selectively locked.

What exactly they claim (claim 1)

1. A semiconductor test apparatus comprising: a base plate; a plurality of side supporters on a lower surface of the base plate; an elastic cylinder and a side stopper on a lower surface of each of the plurality of side supporters; a center stopper laterally spaced apart from the plurality of side supporters on the lower surface of the base plate; a stopper foot at one end of the center stopper; a foot supporter at one end of the stopper foot; a top plate under the base plate and configured to contact the elastic cylinder and the side stopper, wherein the top plate comprises a center hole in a center portion thereof; and a substrate cover under the top plate, wherein the center stopper and the side stopper are configured to be selectively locked.

Facts

Company
Samsung (SAMSUNG ELECTRONICS CO., LTD.)
Official title
Semiconductor test apparatus
Patent number
US12754228B2
Application number
18920172
Filed
Oct 18, 2024
Granted
Oct 6, 2026
Inventors
7
Claims
20

Classified under

G01R 31/2601 Physics & computingH10P 74/273 Electricity & electronics

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Summaries are simplified from the filing’s own abstract and first claim. A patent filing is not a product announcement.
Patent data and drawings: U.S. Patent and Trademark Office (USPTO). Nebula is not affiliated with or endorsed by the USPTO.