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SamsungGranted patentChips & hardwareInterest 3/10

Samsung patents method to fix chip mask defects with a tiny probe

Samsung describes a technique for cleaning up microscopic flaws in the stencils used to make computer chips. The method uses an atomic force microscope, a tool that scans surfaces with a needle-like tip, to identify and physically scrape away specific defects.

Why it mattersThis improves the precision of semiconductor manufacturing by allowing engineers to repair tiny errors in the masks that define circuit patterns.

In the filing’s own words

A method of removing a defect of a mask may include generating a probe profile, the probe profile including characteristics of a probe of an atomic force microscope (AFM); generating a design-based reference image of a defect area by applying the probe profile to a design image of the defect area of the mask including a location of the defect; obtaining an AFM image of the defect area by scanning the defect area of the mask using the probe of the AFM; recognizing the defect as a recognized defect by comparing the AFM image of the defect area with the design-based reference image; and removing the recognized defect using the probe of the AFM.

What exactly they claim (claim 1)

1. A method of removing a defect of a mask, the method comprising: generating a probe profile, the probe profile including characteristics of a probe of an atomic force microscope (AFM); generating a design-based reference image of a defect area by applying the probe profile to a design image of the defect area of the mask including a location of the defect; obtaining an AFM image of the defect area by scanning the defect area of the mask using the probe of the AFM; recognizing the defect as a recognized defect by comparing the AFM image of the defect area with the design-based reference image; and removing the recognized defect using the probe of the AFM.

Facts

Company
Samsung (Samsung Electronics Co., Ltd.)
Official title
Method of removing defect of mask
Patent number
US12736870B2
Application number
18522627
Filed
Nov 29, 2023
Granted
Sep 15, 2026
Inventors
2
Claims
20

Classified under

G03F 1/72 Physics & computingG01Q 30/04 Physics & computingG01Q 40/02 Physics & computingG01Q 60/38 Physics & computingG06T 7/001 Physics & computingG06T 2207/10061 Physics & computing

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Summaries are simplified from the filing’s own abstract and first claim. A patent filing is not a product announcement.
Patent data and drawings: U.S. Patent and Trademark Office (USPTO). Nebula is not affiliated with or endorsed by the USPTO.