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Samsung patents transistor design with dual voltage control layers

This patent describes a specific layout for a transistor, a tiny switch used in computer chips. It features a gate structure with two separate conductive patterns designed to adjust the voltage needed to turn the switch on or off. The design also includes a layered drain region with different levels of impurity doping to manage how electricity flows through the device.

Why it mattersThis is a routine improvement to semiconductor manufacturing that helps engineers fine-tune the performance and power efficiency of microchips.

In the filing’s own words

A transistor includes a substrate including a P-type-sub region doped with P-type impurities, a well region positioned at an upper portion of the substrate and doped with P-type impurities, a gate structure on the well region, and drain and source regions. The gate structure includes a gate insulation layer, first and second conductive patterns for adjusting a threshold voltage and a gate electrode. The drain and source regions are positioned at an upper portion of the substrate adjacent first and second sidewalk of the gate structure, respectively. The source region is doped with N-type impurities. The drain region includes a highly doped N-type impurity region, an N-type impurity region, and a lightly doped P-type impurity region sequentially disposed in a downward direction from a top surface of the substrate. A boundary between the well region and the P-type sub region is positioned under a bottom of the drain region.

What exactly they claim (claim 1)

1. A transistor, comprising: a substrate having a bulk region including a P-type-sub region that is doped with P-type impurities; a well region positioned at an upper portion of the substrate, the well region is doped with P-type impurities; a gate structure on the well region; the gate structure including a gate insulation layer, a first conductive pattern for adjusting a threshold voltage; a second conductive pattern for adjusting a threshold voltage, and a gate electrode; a drain region positioned at an upper portion of the substrate adjacent to a first sidewall of the gate structure; and a source region doped with N-type impurities and positioned at an upper portion of the substrate adjacent to a second sidewall of the gate structure, the second sidewall of the gate structure facing the first sidewall of the gate structure; an additional impurity region protruding from one sidewall of the drain region towards the source region, wherein the additional impurity region is doped with N-type impurities, and is spaced apart from an upper surface of the substrate; wherein the drain region includes a highly doped N-type impurity region; an N-type impurity region having a lower N-type impurity concentration than the highly doped N-type impurity region, and a lightly doped P-type impurity region sequentially disposed in a downward direction from a top surface of the substrate towards a bottom surface of the substrate, wherein a boundary between the well region and the P-type-sub region is positioned under a bottom of the drain region, and wherein a first portion of the lightly doped P-type impurity region of the drain region directly contacts the P-type-sub region, and a second portion of the lightly doped P-type impurity region of the drain region directly contacts the well region.

Facts

Company
Samsung (SAMSUNG ELECTRONICS CO., LTD.)
Official title
Transistor
Patent number
US12733202B2
Application number
18092246
Filed
Dec 31, 2022
Granted
Sep 8, 2026
Inventors
3
Claims
18

Classified under

H10D 30/65 Electricity & electronicsH10D 30/0281 Electricity & electronicsH10D 30/6211 Electricity & electronicsH10D 62/157 Electricity & electronicsH10D 64/01318 Electricity & electronicsH10D 64/017 Electricity & electronics

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Summaries are simplified from the filing’s own abstract and first claim. A patent filing is not a product announcement.
Patent data and drawings: U.S. Patent and Trademark Office (USPTO). Nebula is not affiliated with or endorsed by the USPTO.