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Samsung patents chip design with a specific gate spacer shape

This filing describes a specific layout for the gate structure inside a semiconductor chip. It uses a layered insulating material with a recessed area and a metal layer, where a spacer component fits into that recess to cover the side of the gate.

Why it mattersThis is a detailed structural improvement to how transistors are built on a chip, which helps maintain the stability of the device's electrical connections.

In the filing’s own words

A semiconductor device includes a substrate including a peripheral active pattern defined by a device isolation layer, a gate structure on the peripheral active pattern, and a gate spacer covering at least a portion of a side surface of the gate structure. The gate structure includes an insulating pattern structure and a metal pattern structure on the insulating pattern structure. The insulating pattern structure includes a recess having a maximum depth in a first direction parallel to a top surface of the substrate at a first height. The insulating pattern structure includes a first gate insulating pattern and a high-k dielectric layer, which are sequentially stacked on the top surface of the substrate. The gate spacer includes a protrusion inserted in the recess.

What exactly they claim (claim 1)

1. A semiconductor device comprising: a substrate including a peripheral active pattern defined by a device isolation layer; a gate structure on the peripheral active pattern; and a gate spacer covering at least a portion of a side surface of the gate structure, wherein the gate structure comprises an insulating pattern structure and a metal pattern structure on the insulating pattern structure, wherein the insulating pattern structure includes a recess having a maximum depth in a first direction parallel to a top surface of the substrate at a first height, wherein the insulating pattern structure comprises a first gate insulating pattern and a high-k dielectric layer, which are sequentially stacked on the top surface of the substrate, and wherein the gate spacer includes a protrusion in the recess, wherein the first height is higher than a height of an upper surface of the first gate insulating pattern.

Facts

Company
Samsung (SAMSUNG ELECTRONICS CO., LTD.)
Official title
Semiconductor device
Patent number
US12733160B2
Application number
18456655
Filed
Aug 28, 2023
Granted
Sep 8, 2026
Inventors
9
Claims
20

Classified under

H10B 12/50 Electricity & electronicsH10B 12/315 Electricity & electronicsH10B 12/482 Electricity & electronicsH10B 12/485 Electricity & electronicsH10B 12/488 Electricity & electronics

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Summaries are simplified from the filing’s own abstract and first claim. A patent filing is not a product announcement.
Patent data and drawings: U.S. Patent and Trademark Office (USPTO). Nebula is not affiliated with or endorsed by the USPTO.