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Samsung patents AI method to spot defects by checking nearby points

Patent drawing
Patent drawing from the official filing.

Samsung describes a computer method that uses AI to find flaws in objects by analyzing small sections of the item. The system looks at a specific point and its neighbors to decide if a defect exists, rather than just looking at the point in isolation.

Why it mattersThis could help factories find tiny mistakes in products faster by using context from surrounding areas to make more accurate judgments.

In the filing’s own words

A processor-implemented method including identifying respective first scores related to a defectiveness degree of a plurality of points of a target object; generating a second score indicating a defectiveness degree of a first point of the plurality of points by using a first artificial intelligence (AI) model to classify whether a defect is present based on the respective first scores corresponding to one or more second points of the plurality of points, the one or more second points being within in a predetermined distance of the first point, and a segmented image of the first point; and determining a presence of a defect in the target object based on respective second scores corresponding to the plurality of points.

What exactly they claim (claim 1)

1. A processor-implemented method, the method comprising: identifying respective first scores related to a defectiveness degree of a plurality of points of a target object; generating a second score indicating a defectiveness degree of a first point of the plurality of points by using a first artificial intelligence (AI) model to classify whether a defect is present based on the respective first scores corresponding to one or more second points of the plurality of points, the one or more second points being within in a predetermined distance of the first point, and a segmented image of the first point; and determining a presence of a defect in the target object based on respective second scores corresponding to the plurality of points.

Facts

Company
Samsung (Samsung Electronics Co., Ltd.)
Official title
METHOD AND DEVICE WITH DEFECT DETECTION
Publication number
US20260319872A1
Application number
19464856
Filed
Jan 30, 2026
Published
Oct 15, 2026
Inventors
5
Claims
20

Classified under

G06F 11/0754 Physics & computingG06F 11/0715 Physics & computing

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Summaries are simplified from the filing’s own abstract and first claim. A patent filing is not a product announcement.
Patent data and drawings: U.S. Patent and Trademark Office (USPTO). Nebula is not affiliated with or endorsed by the USPTO.